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Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18
Figure 1: Graphene flake composed of monolayer, bilayer, and triple-layer graphene after water-assisted etchi...
Figure 2: A) Optical microscope image of a graphene flake prior to patterning; B) SEM image of the same flake...
Figure 3: A) AFM profiles of the etched lines, with different dwell times (td = 1, 10, and 100 μs) and variab...
Figure 4: Results of in situ AFM measurements of the etched lines on the SiO2/Si substrate as a function of t...